IEEE Transactions on Device and Materials Reliability
Leading citation impact metric from Clarivate Journal Citation Reports
63 papers with at least that number of citations each
State Council for Professorship (HĐGSNN) Scoring
Quyết định số 26/QĐ-HĐGSNN ngày 11/7/2025 (Mục quốc tế)
HĐGSNN Score History
By article publication year| Year | Max Score | Evaluation Details | Source |
|---|---|---|---|
| 2026 | 1.75đ | WoS Q2 có IF ≥ 2.0(IF: 2.7) | 🔵 Computed |
| 2025 | 1.75đ | WoS Q2 có IF ≥ 2.0(IF: 2.3) | 🔵 Computed |
| 2024 | 1.75đ | WoS Q2 có IF ≥ 2.0(IF: 2.5) | 🔵 Computed |
| 2023 | 1.75đ | WoS Q2 có IF ≥ 2.0(IF: 2) | 🔵 Computed |
| 2022 | 1.50đ | WoS Q2(IF: 1.886) | 🔵 Computed |
| 2021 | 1.50đ | WoS Q2(IF: 1.761) | 🔵 Computed |
| 2020 | 1.50đ | WoS Q2(IF: 1.407) | 🔵 Computed |
| 2019 | 1.50đ | WoS Q2(IF: 1.583) | 🔵 Computed |
| 2018 | 1.50đ | WoS Q2(IF: 1.512) | 🔵 Computed |
Note: Domestic journal scores are officially collected from annual HĐGSNN decisions across councils. International journal scores are dynamically computed according to Decision 26/QĐ-HĐGSNN based on quartile and citation metrics in the publication year.
Aims & Scope
The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Measures cumulative publication volume and citation impact.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
| Category | Index | Rank | Quartile |
|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | JCRSCIE | 186/369 | Q3 |
PHYSICS, APPLIED | JCRSCIE | 107/191 | Q3 |
ENGINEERING, ELECTRICAL & ELECTRONIC | JCISCIE | 193/371 | Q3 |
PHYSICS, APPLIED | JCISCIE | 93/191 | Q2 |
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
| Year | Impact Factor | Articles / Year | Total Citations |
|---|---|---|---|
| 2026 | — | 112 | 98 |
| 2025 | 2.3 | 151 | 231 |
| 2024 | 2.5 | 109 | 479 |
| 2023 | 2 | 102 | 629 |
| 2022 | 1.886 | 96 | 767 |
| 2021 | 1.761 | 120 | 1,198 |
| 2020 | 1.407 | 122 | 1,365 |
| 2019 | 1.583 | 126 | 1,662 |
| 2018 | 1.512 | 104 | 1,529 |
| 2017 | — | 122 | 1,704 |
| 2016 | — | 140 | 2,210 |
| 2015 | — | 112 | 1,518 |
Journal Metrics & Citation Visualizations
Impact Factor Trend (2018–2024)
Clarivate IF trend for IEEE Transactions on Device and Materials Reliability
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
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Journals in the same research field with comparable impact metrics