Journal of Electronic Testing-Theory and Applications
Leading citation impact metric from Clarivate Journal Citation Reports
31 papers with at least that number of citations each
State Council for Professorship (HĐGSNN) Scoring
Quyết định số 26/QĐ-HĐGSNN ngày 11/7/2025 (Mục quốc tế)
HĐGSNN Score History
By article publication year| Year | Max Score | Evaluation Details | Source |
|---|---|---|---|
| 2026 | 1.00đ | WoS Q4(IF: 1.2) | 🔵 Computed |
| 2025 | 1.00đ | WoS Q4(IF: 1.3) | 🔵 Computed |
| 2024 | 1.00đ | WoS Q4(IF: 1.1) | 🔵 Computed |
| 2023 | 1.00đ | WoS Q4(IF: 0.9) | 🔵 Computed |
| 2022 | 1.00đ | WoS Q4(IF: 0.795) | 🔵 Computed |
| 2021 | 1.00đ | WoS Q4(IF: 0.88) | 🔵 Computed |
| 2020 | 1.00đ | WoS Q4(IF: 0.596) | 🔵 Computed |
| 2019 | 1.00đ | WoS Q4(IF: 0.625) | 🔵 Computed |
| 2018 | 1.00đ | WoS Q4(IF: 0.554) | 🔵 Computed |
Note: Domestic journal scores are officially collected from annual HĐGSNN decisions across councils. International journal scores are dynamically computed according to Decision 26/QĐ-HĐGSNN based on quartile and citation metrics in the publication year.
Aims & Scope
The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art. Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics: Testing of VLSI devices printed circuit boards, and electronic systems; Testing of analog and digital electronic circuits; Testing of microprocessors, memories, and signal processing devices; Fault modeling; Test generation; Fault simulation; Testability analysis; Design for testability; Synthesis for testability; Built-in self-test; Test specification; Fault tolerance; Formal verification of hardware; Simulation for verification; Design debugging; AI methods and expert systems for test and diagnosis; Automatic test equipment (ATE); Test fixtures; Electron Beam Test Systems; Test programming; Test data analysis; Economics of testing; Quality and reliability; CAD Tools; Testing of wafer-scale integration devices; Testing of reliable systems; Manufacturing yield and design for yield improvement; Failure mode analysis and process improvement
SCImago & Scopus Journal Intelligence
Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact
Weighted prestige citation metric per document indexed in the Scopus database.
Measures cumulative publication volume and citation impact.
Average citations received per document published in the 2-year window.
Estimated Article Processing Charge for Open Access publication.
Scopus 3-Year Publication & Citation Window
Aggregated from Scopus database across the 3-year SJR evaluation window.
Societal Impact & Inclusivity (SCImago)
Citations in government and international policy documents
Percentage of female authors published in the journal
Real-world societal policy reach and author gender diversity tracked by SCImago.
Scopus Subject Categories
Chinese Academy of Sciences (CAS) Classification
Major / minor zone classification and CAS Early Warning List history
Publishing & Editorial Information
Detailed publisher, peer-review turnaround, and publication cycle specifications
WoS Categories & Quartiles
Detailed JCR / JCI category rankings and quartile breakdown from Clarivate
| Category | Index | Rank | Quartile |
|---|---|---|---|
ENGINEERING, ELECTRICAL & ELECTRONIC | JCRSCIE | 310/369 | Q4 |
ENGINEERING, ELECTRICAL & ELECTRONIC | JCISCIE | 295/371 | Q4 |
Annual Historical Statistics & Publications
Track annual publication volume, total citations, and Impact Factor evolution
| Year | Impact Factor | Articles / Year | Total Citations |
|---|---|---|---|
| 2026 | — | 40 | 3 |
| 2025 | 1.3 | 56 | 74 |
| 2024 | 1.1 | 61 | 179 |
| 2023 | 0.9 | 55 | 178 |
| 2022 | 0.795 | 58 | 352 |
| 2021 | 0.88 | 64 | 336 |
| 2020 | 0.596 | 71 | 351 |
| 2019 | 0.625 | 80 | 478 |
| 2018 | 0.554 | 70 | 558 |
| 2017 | — | 67 | 407 |
| 2016 | — | 74 | 581 |
| 2015 | — | 57 | 457 |
Journal Metrics & Citation Visualizations
Impact Factor Trend (2018–2024)
Clarivate IF trend for Journal of Electronic Testing-Theory and Applications
Total Cites vs Self-Cites
Evaluation of scholarly independence and citation reach
Citations per Document
Citation metric windows across 2, 3, and 4 years
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