SciSight Ecosystem
WoS SCIE Q1Subscription

IEEE Design & Test of Computers

Abbreviation (ISO):IEEE DES TEST COMPUT
Country: United States•WoS SCIE Quartile: Q1•Identifier (ISSN):0740-7475(Print)•Articles / Year: 41
Clarivate JCR Index Advisory: Not Indexed in Latest JCR
Clarivate Impact Factor (IF 2024)Q1
N/A

Leading citation impact metric from Clarivate Journal Citation Reports

H-Index (Hirsch Index)
N/A

papers with at least that number of citations each

WoS: SCIE / JCRQ1
Self-Citation RateN/A
Safe Level (< 15%)Warning Level (> 20%)
Self-citation below 15% indicates strong scholarly independence.
Volume & Open AccessSubscription
41articles/year
0% Gold OA•0% Original Research

Aims & Scope

IEEE Design & Test of Computers is a leading international peer-reviewed journal publishing original research, clinical updates, and reviews indexed in Clarivate Web of Science (SCIE) with Q1 quartile ranking.

Topics Covered (Recognized by AI)
Computer science99.7%Engineering82.6%Embedded system43.2%Electrical engineering37%Operating system34.6%Physics33.8%Programming language31.8%Computer architecture30.9%Software engineering30.8%Mathematics30%Quantum mechanics25.4%Biology24.9%Electronic engineering23.3%Reliability engineering21.5%Geology20.6%

SCImago & Scopus Journal Intelligence

Not indexed in SCImago / Scopus database

This journal is currently not indexed in Scopus or is an academic publication indexed exclusively in Web of Science (WoS).

Chinese Academy of Sciences (CAS) Classification

Major / minor zone classification and CAS Early Warning List history

Major Category (Broad Field):
Updating
Minor Category (Specific Field):
Updating
CAS Early Warning List History:
Updated annually: 2020 – 2024
2020
Not warned
2021
Not warned
2022
Not warned
2023
Not warned
2024
Not warned

Publishing & Editorial Information

Detailed publisher, peer-review turnaround, and publication cycle specifications

Publisher Review Speed
Updating
Average time to first editorial decision
Online Publication Speed
Updating
Time from acceptance to online publication
Official Acceptance Rate
Updating
Manuscript acceptance rate confirmed by the publisher
Open Access Model
Subscription
OA publishing option or traditional subscription
Publisher
Updating
Publication Language
English
Frequency
Bimonthly
Founding Year
1984
Editorial Address
IEEE COMPUTER SOC, 10662 LOS VAQUEROS CIRCLE, PO BOX 3014, LOS ALAMITOS, USA, CA, 90720-1314
Indexing & Databases
PubMed

WoS Categories & Quartiles

Detailed JCR / JCI category rankings and quartile breakdown from Clarivate

Clarivate JCR

No WoS category details available for this journal.

Annual Historical Statistics & Publications

Track annual publication volume, total citations, and Impact Factor evolution

14 year
YearImpact FactorArticles / YearTotal Citations
20250——
20240——
2023010
2020—30
2019—10
2018—10
2017—70
2016—90
2015—40
2013—10
2012—1601,050
2011—1381,200
2010—1474,133
2009—1412,000
Academic Metric Intelligence

Journal Metrics & Citation Visualizations

Impact Factor Trend (2018–2024)

Clarivate IF trend for IEEE Design & Test of Computers

WoS Q1
00002023202420250.00
Annual Impact Factor Metric
2025:0

Total Cites vs Self-Cites

Evaluation of scholarly independence and citation reach

Total citations steady growth
Self-citation: N/A

Citations per Document

Citation metric windows across 2, 3, and 4 years

Cites / Doc (4 years)Cites / Doc (3 years)Cites / Doc (2 years)

Similar Journals in Discipline

Journals in the same research field with comparable impact metrics

Record UUID: 9e624f5a-3a92-43b8-b731-7f5318d9700a
Database Updated: 2026-10-01