SciSight Ecosystem
WoS SCIE Q3Scopus Q2SCImago #12,696CAS 4区Hybrid

Microelectronics Reliability

Abbreviation (ISO):Microelectron. Reliab
Country: England•WoS SCIE Quartile: Q3•Scopus SJR: 0.464•SCImago Rank: #12,696•Identifier (ISSN):0026-2714(Print)•Articles / Year: 355•Estimated Publication Fee (APC): $2,840 USD
Clarivate IF (2026)Q3
2.5
↑ +0.6

Leading citation impact metric from Clarivate Journal Citation Reports

JCR Release Date: 2026-06-17
H-Index (2021)
80

80 papers with at least that number of citations each

WoS: SCIE / JCRQ3
Self-Citation Rate12.5%
Safe Level (< 15%)Warning Level (> 20%)
Self-citation below 15% indicates strong scholarly independence.
Volume & Open AccessHybrid
355articles/year
17.15% Gold OA•98.78% Original Research

State Council for Professorship (HĐGSNN) Scoring

Quyết định số 26/QĐ-HĐGSNN ngày 11/7/2025 (Mục quốc tế)

1.50pts
Latest Max Score
Estimated (Dec 26)
Scoring Basis: WoS Q3(IF: 2.5)

HĐGSNN Score History

By article publication year
YearMax ScoreEvaluation DetailsSource
20261.50đ
WoS Q3(IF: 2.5)
🔵 Computed
20251.50đ
WoS Q3(IF: 1.9)
🔵 Computed
20241.50đ
WoS Q3(IF: 1.6)
🔵 Computed
20231.50đ
WoS Q3(IF: 1.6)
🔵 Computed
20221.50đ
WoS Q3(IF: 1.418)
🔵 Computed
20211.50đ
WoS Q3(IF: 1.589)
🔵 Computed
20201.50đ
WoS Q3(IF: 1.535)
🔵 Computed
20191.50đ
WoS Q3(IF: 1.483)
🔵 Computed
20181.50đ
WoS Q3(IF: 1.236)
🔵 Computed

Note: Domestic journal scores are officially collected from annual HĐGSNN decisions across councils. International journal scores are dynamically computed according to Decision 26/QĐ-HĐGSNN based on quartile and citation metrics in the publication year.

Aims & Scope

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

Topics Covered (Recognized by AI)
Engineering84.2%Physics74.8%Computer science73.3%Quantum mechanics62.7%Materials science58.2%Electrical engineering51%Optoelectronics38.2%Chemistry37.2%Thermodynamics37%Organic chemistry30%Mathematics28.9%Composite material28.5%Reliability engineering27.8%Power (physics)24.4%Electronic engineering23.1%Metallurgy22.1%Nanotechnology21.8%Operating system20.5%

SCImago & Scopus Journal Intelligence

Global SCImago ranking, SJR prestige index, Scopus coverage, and societal policy impact

Rank #12,696Scopus Q2SCImago Profile
Scopus Coverage:1962-2026
Scopus Broad Areas:EngineeringMaterials SciencePhysics and Astronomy
Scopus Citation Rank (SJR)Q2
0.464

Weighted prestige citation metric per document indexed in the Scopus database.

Tứ phân vị: Scopus Q2
Scopus H-Index (2025)
115

Measures cumulative publication volume and citation impact.

Scopus Database Indexed (2025)
Citations / Doc (2 years)
2.77

Average citations received per document published in the 2-year window.

2-Year Citation Window
Estimated Publication Fee (APC)
$2,840 USD

Estimated Article Processing Charge for Open Access publication.

Chi phí ước tính / bài báo

Scopus 3-Year Publication & Citation Window

3-Year Citations2,207
3-Year Documents831
Citable Documents826

Aggregated from Scopus database across the 3-year SJR evaluation window.

Societal Impact & Inclusivity (SCImago)

Policy Citations (Overton)0

Citations in government and international policy documents

Female Author Rate26.1%

Percentage of female authors published in the journal

Real-world societal policy reach and author gender diversity tracked by SCImago.

Scopus Subject Categories

Atomic and Molecular Physics, and OpticsQ2
Condensed Matter PhysicsQ2
Electrical and Electronic EngineeringQ2
Electronic, Optical and Magnetic MaterialsQ2
Safety, Risk, Reliability and QualityQ2
Surfaces, Coatings and FilmsQ2
Nanoscience and NanotechnologyQ3

Chinese Academy of Sciences (CAS) Classification

Major / minor zone classification and CAS Early Warning List history

Major Category (Broad Field):
4区 (Zone 4)Engineering & Technology
Minor Category (Specific Field):
4区ENGINEERING, ELECTRICAL & ELECTRONIC
CAS Early Warning List History:
Updated annually: 2020 – 2024
2020
Not warned
2021
Not warned
2022
Not warned
2023
Not warned
2024
Not warned

Publishing & Editorial Information

Detailed publisher, peer-review turnaround, and publication cycle specifications

Publisher Review Speed
8.3周
Average time to first editorial decision
Online Publication Speed
13.3周
Time from acceptance to online publication
Official Acceptance Rate
Updating
Manuscript acceptance rate confirmed by the publisher
Open Access Model
Hybrid
OA publishing option or traditional subscription
Publisher
Elsevier Ltd
Publication Language
English
Frequency
Monthly
Founding Year
1964
Editorial Address
PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
Indexing & Databases
SCIEScopusPubMed

WoS Categories & Quartiles

Detailed JCR / JCI category rankings and quartile breakdown from Clarivate

Clarivate JCR & JCI
CategoryIndexRankQuartile
ENGINEERING, ELECTRICAL & ELECTRONIC
JCRSCIE
204/369Q3
NANOSCIENCE & NANOTECHNOLOGY
JCRSCIE
109/148Q3
PHYSICS, APPLIED
JCRSCIE
114/191Q3
ENGINEERING, ELECTRICAL & ELECTRONIC
JCISCIE
266/371Q3
NANOSCIENCE & NANOTECHNOLOGY
JCISCIE
111/148Q3
PHYSICS, APPLIED
JCISCIE
140/191Q3

Annual Historical Statistics & Publications

Track annual publication volume, total citations, and Impact Factor evolution

12 year
YearImpact FactorArticles / YearTotal Citations
2026—25383
20251.9320872
20241.61891,091
20231.63272,452
20221.4183472,947
20211.5893614,195
20201.5353673,951
20191.4833363,680
20181.2365067,893
2017—5148,383
2016—6626,048
2015—4467,086
Academic Metric Intelligence

Journal Metrics & Citation Visualizations

Impact Factor Trend (2018–2024)

Clarivate IF trend for Microelectronics Reliability

WoS Q3
0123201820192020202120222023202420251.90
Annual Impact Factor Metric
2025:1.9

Total Cites vs Self-Cites

Evaluation of scholarly independence and citation reach

Total citations steady growth
Self-citation: 12.5%

Citations per Document

Citation metric windows across 2, 3, and 4 years

Cites / Doc (4 years)Cites / Doc (3 years)Cites / Doc (2 years)

Similar Journals in Discipline

Journals in the same research field with comparable impact metrics

Record UUID: fa310975-2871-4c31-bf27-46350a4015cc
Database Updated: 2026-09-30