Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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Ultramicroscopy
Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
Acta Microscopica
Acta Microscopica is the official journal of CIASEM (Interamerican Committee of Societies for Electron Microscopy). This journal is an international forum, open to all scientists and technologists that use any form of microscopy, electron microscopy, new scanning probe microscopy and also confocal and optical microscopy for applications in physics, chemistry, materials and biological sciences, for publishing their research. The journal has appointed eminent scientists from around the world to be Regional Editors. Acta Microscopica was founded in 1992 and publishes two issues per year. The article covers scientific articles in applications to life and material sciences. Review and educational articles on different topics of interest related to microscopy, also articles in methods, techniques, and instrumentation. Articles are reviewed by at least two international experts in the field. Readers may download material for their own use only or for use as educational materials. No commercial use is allowed without prior written consent.
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.